A retrospective job exposure matrix for estimating exposure to 2,3,7,8-tetrachlorodibenzo-p-dioxin.
Piacitelli-LA; Sweeney-M; Marlow-D; Fingerhut-M; Steenland-K
American Industrial Hygiene Conference and Exposition, May 9-15, 1998, Atlanta, Georgia. Fairfax, VA: American Industrial Hygiene Association, 1998 May; :74
A job exposure matrix was developed to estimate cumulative 2,3, 7,8-tetrachlorodibenzo-p-dioxin (TCDD) exposure for a subcohort of 3,538 workers at 8 of the 12 U.S. plants that produced 2,4,5-trichlorophenol or one of it's derivatives between 1942 to 1984. These exposure estimates will be used in exposure-response analyses in an update of a 1991 NIOSH cohort mortality study. The exposure matrix was developed to account for job, plant, and era dependent differences in TCDD exposure. The TCDD exposure estimates are based on (1) the concentration of TCDD in micrograms per gram present in process materials; (2) the duration of exposure to TCDD contamination, expressed as a fraction of a work day; and (3) a qualitative contact factor (0.05-1.5) to account for the extent of worker contact with the TCDD contaminated material. These three factors are multiplied together to yield a daily TCDD exposure score. The sum of the daily exposure scores constituted an individual's cumulative exposure score. Daily TCDD exposure scores range from 0.001 to 1250. Cumulative TCDD exposure scores are distributed from 0.002 to 1,651,611 exposure score days. The TCDD cumulative exposure score, which incorporates both duration and level of exposure, provides a means for ranking workers for evaluating the relationship between TCDD exposure and mortality in a retrospective cohort study analysis.
Dioxins; Humans; Dose-response; Chlorinated-hydrocarbons; Environmental-contamination; Chemical-manufacturing-industry; Chemical-industry-workers; Workplace-studies; Job-analysis; Exposure-assessment; Employee-exposure; Industrial-exposures; Chlorinated-dioxins; Chlorinated-phenols
DSHEFS; EID; OD
American Industrial Hygiene Conference and Exposition, May 9-15, 1998, Atlanta, Georgia