Understanding and quantifying arc flash hazards in the mining industry.
Authors
Homce GT; Cawley JC
Source
IAS '07: Conference Record of the 2007 IEEE Industry Applications Conference: Forty-second IAS Annual Meeting, September 23-27, 2007, New Orleans, Louisiana. Piscataway, NJ: Institute of Electrical and Electronics Engineers, 2007 Sep; 4:1364-1372
Arc flash generally refers to the dangerous exposure to thermal energy released by an arcing fault on an electrical power system, and in recent years, arc flash hazards have become a prominent safety issue in many industries. This problem however, has not been effectively addressed in the mining industry. MSHA data for the period 1990 through 2001 attributes 836 injuries to "non-contact electric arc burns", making it the most common cause of electrical injury in mining. This paper presents results from several elements of a recent NIOSH study of arc flash hazards in mining, and provides information and recommendations that can help reduce these injuries. Characteristics of past arc flash injuries in mining are first outlined, such as the electrical components and work activities involved (based on MSHA data). This is followed by a review of important concepts and terminology needed to understand this hazard. Next, methods for identifying, measuring, and managing arc flash hazards on a power system are covered, with emphasis on recommendations found in NFPA 70E, Standard for Electrical Safety in the Workplace. Finally, results are presented from a detailed arc flash hazard analysis performed on a sample mine electrical power system using IEEE 1584-2004a, focusing on components and locations presenting severe hazards as well as engineering solutions for reducing the risk to personnel.
U.S. DHHS, CDC, NIOSH, Pittsburgh Research Laboratory, 626 Cochrans Mill Road, P.O. Box 18070, Pittsburgh, PA 15236 USA
Publication Date
20070901
Document Type
Conference/Symposia Proceedings
Email Address
GHomce@cdc.gov
Fiscal Year
2007
ISBN No.
9781424412594
ISSN
0197-2618
NIOSH Division
PRL
Source Name
IAS '07: Conference Record of the 2007 IEEE Industry Applications Conference: Forty-second IAS Annual Meeting, September 23-27, 2007, New Orleans, Louisiana
Links with this icon indicate that you are leaving the CDC website.
The Centers for Disease Control and Prevention (CDC) cannot attest to the accuracy of a non-federal website.
Linking to a non-federal website does not constitute an endorsement by CDC or any of its employees of the sponsors or the information and products presented on the website.
You will be subject to the destination website's privacy policy when you follow the link.
CDC is not responsible for Section 508 compliance (accessibility) on other federal or private website.
For more information on CDC's web notification policies, see Website Disclaimers.
CDC.gov Privacy Settings
We take your privacy seriously. You can review and change the way we collect information below.
These cookies allow us to count visits and traffic sources so we can measure and improve the performance of our site. They help us to know which pages are the most and least popular and see how visitors move around the site. All information these cookies collect is aggregated and therefore anonymous. If you do not allow these cookies we will not know when you have visited our site, and will not be able to monitor its performance.
Cookies used to make website functionality more relevant to you. These cookies perform functions like remembering presentation options or choices and, in some cases, delivery of web content that based on self-identified area of interests.
Cookies used to track the effectiveness of CDC public health campaigns through clickthrough data.
Cookies used to enable you to share pages and content that you find interesting on CDC.gov through third party social networking and other websites. These cookies may also be used for advertising purposes by these third parties.
Thank you for taking the time to confirm your preferences. If you need to go back and make any changes, you can always do so by going to our Privacy Policy page.