Alternative filters for crystalline silica analysis.
Key-Schwartz R; Ramsey D; Archibald M
American Industrial Hygiene Conference and Exposition, June 1-6, 2002, San Diego, California. Fairfax, VA: American Industrial Hygiene Association, 2002 Jun; :87
X-ray diffraction analysis of crystalline silica is currently accomplished by deposition of the sample onto silver membrane filters. An alternative type of filter has been investigated for use in X-ray diffraction analysis. A thin layer of silver was evaporatively coated onto polypropylene and nylon capillary pore filters. Scanning electron microscopy of the coated filters indicated that the filtration characteristics of the substrate filters were not changed significantly by the deposition of the thin silver layer on the surface. Coated capillary pore filters may enable an improvement in sensitivity for crystalline silica analysis over that seen with the use of conventional silver "tortuous pore" membrane filters. Polypropylene and nylon were chosen from several filter substrate materials due to their smooth surface, their chemical resistance to tetrahydrofuran, and their availability in the required 0.45 um pore size.
Filters; Silica-dusts; Microscopy; Membrane-filters; X-ray-analysis; Sampling-equipment; Filter-materials; Filter-membranes
Research Tools and Approaches; Exposure Assessment Methods
American Industrial Hygiene Conference and Exposition, June 1-6, 2002, San Diego, California