Radioisotopic x-ray analysis with semiconductor detectors was evaluated for determining silver in ores. X-ray and scatter peak intensities were obtained using computer processing for curve fitting backgrounds under the ag ka peaks and unfolding overlapping spectra. The discrete compton and coherent scatter peaks obtainable with monoenergetic excitation were evaluated as internal standards for matrix compensation. The ag ka-to-compton ratio provides compensation for x-ray absorption and a single, linear calibration curve can be used for silver determination in both uniform and variable matrix ores. For a set of samples taken from a drill core, silver was determined to within +-10 percent for concentrations above 3 oz/ton and the detection limit was 0.3 Oz/ton (10 ppm). For variable matrix ores, silver can be determined within +-20 percent.