Calculations of the intensity of secondary scattering of x-rays by noncrystalline materials. II. Moving sample transmission geometry.
Acta Crystallogr. Sect A. Cryst Phys Diffr Theor Gen Crystallogr 1972 Mar; A28(Pt 2):158-163
Equations that require numerical integration over only one variable were derived for calculating the intensity of secondary scattering of x-rays for noncrystalline samples in the case of a transmission geometry, in which the sample is rotated so that the incident and diffracted beams are always at equal angles with respect to a normal to the faces of the slab of sample. Tables are given that allow the intensity ratios of secondary-to-primary scattering to be determined without making lengthy calculations.
OP; Journal Article
Acta Crystallographica. Section A, Crystal Physics, Diffraction, Theoretical and General Crystallography