Equations that require numerical integration over only one variable were derived for calculating the intensity of secondary scattering of x-rays for noncrystalline samples of finite thickness. Both the reflection and transmission geometry cases were considered. Tables are given that allow the intensity ratio of secondary to primary scattering to be determined without making lengthy calculations. Modification of the normalization procedure when secondary scattering is important is discussed.
OP; Journal Article
Acta Crystallographica. Section A, Crystal Physics, Diffraction, Theoretical and General Crystallography
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