NIOSHTIC-2 Publications Search

Diffraction jig for Philips Electronics diffractometers.

Authors
Huggins-CW; Cramer-SD
Source
Norelco Report 1980 Apr; 27(1):1
Link
NIOSHTIC No.
10008451
Abstract
An x-ray diffraction jig for use on Philips Electronics diffractometers was designed and fabricated at the Avondale Research Center primarily for use on corrosion research using 3/8-in-diam metal electrodes that were covered with corrosion films and geothermal scales. The jig was constructed of an aluminum alloy and will handle a variety of sample sizes and shapes up to 1.5 By 2.0 Cm. The jig dimensions and a sample illustration are given in the paper.
CODEN
NORRA5
Publication Date
19800401
Document Type
OP; Journal Article
Fiscal Year
1980
Identifying No.
OP 45-80
Issue of Publication
1
ISSN
0029-1625
NIOSH Division
AVRC
Source Name
Norelco Reporter
State
MD
Page last reviewed: April 12, 2019
Content source: National Institute for Occupational Safety and Health Education and Information Division