Development of a Rapid, Position-sensitive X-ray Diffraction Device for Silica Analysis.
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The objective of this study was to design and fabricate a device with few or no moving parts that could acquire desired x-ray data in a short period of sampling time. A rapid, position-sensitive x-ray diffraction device (based on a parafocusing x-ray geometry and utilizing and x-ray sensitive, phosphor-coated, linear diode array) was developed. The smallest loading of quartz powder consistently detectable with the device was found to be 28.8 Ug/cm2. Loadings as small as 5.8 Ug/cm2 were detected, although not consistently. The device was found to be limited mainly by sample distribution on the substrate filter rather than the total sample weight.
CP; Final Contract Report;
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Univ. of Denver