This report describes the testing of the time domain reflectometry microcomputer (TDRM) system. The automated time domain reflectometry (atdr) software is described and attempts to implement the same assembly language program in a higher level language (plm) are documented along with two versions of the plm program. One plm program uses a data filtering approach to limit noise and the other uses data averaging to reduce noise. The field tests of the analog and digital atdr units are described along with the hardware modifications that resulted. Tests indicate that the digital units are more consistent and less confusing to operate than the analog units. The results indicate that the digital units can locate an abnormality in a test cable to within 5% of the true location (provided the cable phase velocity is known). The digital units can consistently locate shunt faults less than 300 ohms and series faults greater than 30 ohms.
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