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Calculations of the intensity of secondary scattering of x-rays by noncrystalline materials. II. Moving sample transmission geometry.

Authors
Dwiggins-CW Jr.
Source
Acta Crystallogr. Sect A. Cryst Phys Diffr Theor Gen Crystallogr 1972 Mar; A28(Pt 2):158-163
NIOSHTIC No.
10010374
Abstract
Equations that require numerical integration over only one variable were derived for calculating the intensity of secondary scattering of x-rays for noncrystalline samples in the case of a transmission geometry, in which the sample is rotated so that the incident and diffracted beams are always at equal angles with respect to a normal to the faces of the slab of sample. Tables are given that allow the intensity ratios of secondary-to-primary scattering to be determined without making lengthy calculations.
CODEN
ACACBN
Publication Date
19720301
Document Type
OP; Journal Article
Fiscal Year
1972
NTIS Accession No.
NTIS Price
Identifying No.
OP 78-72
ISSN
0567-7394
NIOSH Division
BERC
Source Name
Acta Crystallographica. Section A, Crystal Physics, Diffraction, Theoretical and General Crystallography
State
OK
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