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Methodology for evaluating integral Gaussian profiles.

Authors
Campbell-AB III
Source
Avondale, MD: U.S. Department of the Interior, Bureau of Mines, IC 8811, 1980 Jan; :1-18
Link
NIOSHTIC No.
10006919
Abstract
This Bureau of Mines report describes a method that utilizes a computer program to evaluate integral Gaussian profiles of atomic concentration versus depth in a solid. The specific use illustrated involves profiling ion-implanted metals using proton-induced x-ray emission (pixe) analysis and ion sputtering (is) for sectioning.
Keywords
ABC10 computer program; Alloys; BASIC programming language; Computer programs; Concentration (Composition); Depth; Ion implantation; Ions; Normal density functions; Sputtering; X ray analysis
Publication Date
19800101
Document Type
IH; Information Circular
Fiscal Year
1980
NTIS Accession No.
PB80-158595
NTIS Price
A02
Identifying No.
IC-8811
NIOSH Division
AVRC
Source Name
Avondale, MD: U.S. Department of the Interior, Bureau of Mines, IC 8811
State
MD
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