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Prospectively assessed menstrual cycle characteristics in female wafer-fabrication and nonfabrication semiconductor employees.

Authors
Gold-EB; Eskenazi-B; Hammond-SK; Lasley-BL; Samuels-SJ; Rasor-MO; Hines-CJ; Overstreet-JW; Schenker-MB
Source
Am J Ind Med 1995 Dec; 28(6):799-815
NIOSHTIC No.
00230988
Abstract
The possibility of increased risk of spontaneous abortion (SAB) was examined among women working in the semiconductor industry, particularly those employed in the fabrication (fab) rooms. Baseline demographic factors that might affect menstrual cycle characteristics were compared for 152 fab and 250 nonfab workers. Diaries showed a slightly higher mean cycle length (MCL) per woman in fab than nonfab workers, but this was not a statistically significant difference. The thin film and ion implantation (TFII) and photolithography (PHOTO) groups had significantly higher logarithmic transformation of the mean standard deviation in cycle length (MLSD) than nonfab workers. The significantly higher MCL and MLSD in TFII workers are consistent with the reduced probability of conception seen in the dopants and thin films super group composed of the furnace and TFII work groups. The proportion of women with any short or long cycles was slightly higher in fab than nonfab workers. Women exclusively assigned to the etching group were the only fab workers whose risk of any long cycles was higher than that among all nonfab women. The risk of all cycles being long was highest among TFII workers. The adjusted relative risk for having any short cycles by the fourth cycle was highest among supervisors/engineers. The adjusted relative risk for PHOTO workers was almost double that of nonfab workers. Levels of ethylene based glycol ethers or fluoride exposure did not appear to affect any of the five menstrual cycle outcomes.
Keywords
Semiconductors; Reproductive-system-disorders; Risk-factors; Epidemiology; Reproductive-hazards; Occupational-exposure; Humans; Author Keywords: menstrual cycle; reproduction; epidemiology; risk factors; semiconductor manufacturing; occupational exposures
CODEN
AJIMD8
Publication Date
19951201
Document Type
Journal Article
Funding Amount
1055222
Funding Type
Cooperative Agreement
Fiscal Year
1996
NTIS Accession No.
NTIS Price
Identifying No.
Cooperative-Agreement-Number-U07-CCU-906162
Issue of Publication
6
ISSN
0271-3586
Source Name
American Journal of Industrial Medicine
State
CA
Performing Organization
University of California - Davis
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