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Industrial Hygiene Walk-Through Survey Report of National Semiconductor, Santa Clara, California, Report No. IWS-113-16.

Authors
Pasquini-D
Source
NIOSH 1981 Jul:17 pages
Link
NIOSHTIC No.
00197325
Abstract
A walk through survey was conducted at the National Semiconductor facility (SIC-3671, 3672, 3673, 3674, 3675, 3676) located in Santa Clara, California for the purpose of identifying and estimating worker exposure to potentially hazardous agents in the electronic component manufacturing industry. The survey team reviewed the facility's health and safety program and the fabrication operations for the metal oxide semiconductor (MOS). At the time of the survey no serious deficiency was noted in the safety and health program. However, the authors recommend that the respiratory protection program be upgraded. Two ventilation problems were identified. The first dealt with the particle shields on combination laminar flow/exhaust hoods and the second with the capacity of the exhaust systems.
Keywords
NIOSH-Author; NIOSH-Survey; Field-Study; IWS-113-16; Region-9; Electronics-industry; Semiconductors; Electrical-workers;
Publication Date
19810701
Document Type
Industry Wide;
Fiscal Year
1981
NTIS Accession No.
PB91-173542
NTIS Price
A03
Identifying No.
IWS-113-16
NIOSH Division
DSHEFS;
SIC Code
3671;
Source Name
Division of Surveillance, Hazard Evaluations, and Field Studies, NIOSH, U.S. Department of Health and Human Services, Cincinnati, Ohio, Report No. IWS-113-16, 17 pages
State
CA; OH;
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