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Luncheon Address.

Authors
LeGrande-D
Source
Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan 1989:305-309
Link
NIOSHTIC No.
00189073
Abstract
During this address the speaker expressed hope that a product of this conference would be more assurance to the workers in the semiconductor industry that safe and healthful workplaces are being provided for them. The data presented at the conference should make this an achievable goal. Concern has been expressed about the health and well being of semiconductor workers by the Communications Workers of America and other representatives of the American labor movement. The industry has frequently been described as clean and safe and comparisons are drawn to earlier smokestack industries. However, often the workplaces of high technology carry with them a stressful working atmosphere and risk exposures to a wide variety of toxic chemicals. Of particular concern are those individuals working for small and midsized companies who may not have adequate knowledge of the hazards and for these employers who may lack personnel and financial resources to provide adequate protection. Specific hazards in this industry include exposure to solvents, acids, alkalies, metals, gases, plastics, resins, fiberglass, and asbestos (1332214) which are used in significant quantities. Efforts to control these exposures include substitution of less toxic materials, local exhaust ventilation, closed systems, process revision, isolation, wet methods, industrial hygiene monitoring, personal protective equipment, medical surveillance, personal hygiene, maintenance, good housekeeping, administrative controls and training of workers.
Keywords
Electronics-industry; Safety-practices; Worker-health; Industrial-safety-programs; Accident-prevention; Legislation; Air-sampling; Ventilation-systems; Air-quality-monitoring; Explosion-prevention; Semiconductors;
CAS No.
1332-21-4;
Publication Date
19890101
Fiscal Year
1989
NTIS Accession No.
NTIS Price
Source Name
Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan
State
MI;
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