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Current Perspective on Occupational Safety and Health Issues at the National Institute for Occupational Safety and Health and Control Needs in Semiconductor Manufacture.

Authors
Bierbaum-PJ
Source
Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan 1989:299-303
Link
NIOSHTIC No.
00188596
Abstract
A brief address was presented concerning the current activities and goals of NIOSH in general and the specific relationship of these activities to semiconductor manufacture. Topics included NIOSH health hazard evaluations, development of a list of the leading work related diseases and injuries, development of prevention strategies to eliminate these conditions, hazards of common and relatively new chemical and physical agents in the semiconductor manufacturing industry, prime examples of areas for primary prevention, and the problem of hazard identification and control in small companies. It was indicated that NIOSH had information on health effects, standard recommendations, and control information for most of the common chemical and physical agents and work conditions found in the industry; control and reduction at the source were cited as preventive measures for the relatively new substance and conditions in this field. Measures for primary prevention were outlined.
Keywords
Semiconductors; Occupational-health-programs; Occupational-exposure; Health-hazards; Chemical-processing; Electronics-industry;
Publication Date
19890101
Fiscal Year
1989
NTIS Accession No.
NTIS Price
Source Name
Hazard Assessment and Control Technology in Semiconductor Manufacturing, Lewis Publishers, Inc., Chelsea, Michigan
State
MI;
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