SEM backscattered electron imaging - an aid to dust and particulate characterization.
NIOSH 1975 Jul; :1-5
A simple method known as backscattered electron (BSE) imaging is described for rapidly identifying the mineral material in the scanning electron microscope. The method can be applied to automatic image analysis systems. With the advent of improvements in the detection of backscattered electrons, BSE imaging has been rediscovered as an important aid to the rapid identification of inorganic dust in mixed samples which contain much organic material.
Mineral-dusts; Dust-analysis; Analytical-methods; Particulates; Analytical-instruments; Scanning-techniques; Inorganic-compounds
NIOSH, Morgantown, West Virginia, Unpublished Report, 5 pages, 9 references